Concept
ZEISS (LEO) 1450 VP Scanning Electron Microscope (SEM)
| URI | http://vocab.nerc.ac.uk/collection/L22/current/TOOL1212/1/ | |
|---|---|---|
| Within Vocab | SeaVoX Device Catalogue | |
| Alternative Labels | LEO 1450VP SEM | |
| Definition | A scanning electron microscope (SEM) used for the imaging and analysis of specimens. The SEM comprises of two main parts, an electron column and electron detector. In the column an electron beam is generated which is rastered across the surface of the sample. Secondary electrons and backscattered electrons are emitted which are collected by the detector and form the specimen image in the microscope. The electron source is LaB6 or tungsten. The SEM can operate at variable pressure from 1Pa to 400Pa and the has a magnification range of 9x to 900,000x. | |
| Date | None | |
| Identifier | TOOL1212 | |
| Note | accepted | |
| Is Version Of | TOOL1212 | |
| version | 1 | |
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