Concept
Panalytical PW2404 wavelength-dispersive sequential X-ray spectrometer
| URI | http://vocab.nerc.ac.uk/collection/L22/current/TOOL1546/ | ||
|---|---|---|---|
| Within Vocab | SeaVoX Device Catalogue | ||
| Alternative Labels | Panalytical PW2404 WDXRF | ||
| Definition | An X-ray spectrometer uses high energy X-rays (or gamma rays) to excite fluorescent radiation or photons from a sample for elemental analysis. It is employed in many industries and applications including: cement production, glass production, mining, mineral beneficiation, iron, steel and non-ferrous metals, petroleum and petrochemicals, polymers and related industries, pharmaceuticals, healthcare products and environmental. In wavelength dispersive X-ray fluorescence spectroscopy (WDXRF), photons emitted by the sample are separated or dispersed by diffraction before hitting the detector. The different energies of the characteristic radiation emitted from the sample are diffracted into different directions by an analyzing crystal or monochrometer. By placing the detector at a certain angle, the intensity of X-rays with a certain wavelength can be measured. Sequential spectrometers use a moving detector on a goniometer to move it through an angular range to measure the intensities of many different wavelengths. | ||
| Date | 2020-09-22T15:40:38 | ||
| Identifier | SDN:L22::TOOL1546 | ||
| Note | accepted | ||
| Has Current Version | 1 | ||
| version | 1 | ||
| inScheme | http://vocab.nerc.ac.uk/scheme/SDNDEV/current/ | ||
| Broader | L05:LAB25 |
X-ray fluorescence analysers | Mapping: 1613953 |
| Related | B75:ORG01073 |
Malvern Panalytical Ltd | Mapping: 1613954 |
L35:MAN0114 |
PANalytical B.V. | Mapping: 1613955 | |
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