Concept
FEI Quanta 650 FEG Scanning Electron Microscope (SEM)
| URI | http://vocab.nerc.ac.uk/collection/L22/current/TOOL2087/ | ||
|---|---|---|---|
| Within Vocab | SeaVoX Device Catalogue | ||
| Alternative Labels | FEI Quanta 650 FEG | ||
| Definition | A Scanning Electron Microscope (SEM) used for the imaging and analysis of materials. Applications include the characterization and in-situ analysis of samples including metals and non-conductive soft materials. The SEM can be operated in high vacuum, low vacuum, and full environmental (ESEM) mode. Multiple imaging detectors available including secondary electron (SE), backscattered electron (BSE), cathodoluminescence (CL), and electron backscattered diffraction (EBSD). Beam deceleration option available to provide improved resolution and contrast. Image processor capable of generating images up to 6144 x 4096 pixels. | ||
| Date | 2024-08-14T16:27:39 | ||
| Identifier | SDN:L22::TOOL2087 | ||
| Note | accepted | ||
| Has Current Version | 1 | ||
| version | 1 | ||
| inScheme | http://vocab.nerc.ac.uk/scheme/SDNDEV/current/ | ||
| Broader | L05:LAB07 |
electron microscopes | Mapping: 1856687 |
| Related | L35:MAN0300 |
FEI Company | Mapping: 1856689 |
B75:ORG00458 |
Thermo Fisher Scientific | Mapping: 1856688 | |
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