Concept
Secondary sampling: discrete
| URI | http://vocab.nerc.ac.uk/collection/R16/current/SECDIS/ | |
|---|---|---|
| Within Vocab | Argo vertical sampling schemes | |
| Alternative Labels | SECDIS | |
| Definition | Secondary sampling scheme for which the 'discrete' sampling method was used. The secondary sampling profile has N_PROF>1, and is composed of measurements that are taken at pressure levels different from the primary sampling profile, or obtained by a sampling method different from that of the primary sampling profile. The 'discrete' sampling method refers to profiles where each data point was obtained from a single measurement (polling) from a sensor. Measurements can be taken by the Primary CTD or by auxiliary sensors. | |
| Date | 2020-05-03T20:29:08 | |
| Identifier | SDN:R16::SECDIS | |
| Note | accepted | |
| Has Current Version | 1 | |
| version | 1 | |
Alternate Formats
Other formats for this page:
RDF/XML Turtle JSON-LDAlternate Profiles
Other views of this page:
Alternate Profiles ?Different Media Types (HTML, text, RDF, JSON etc.) and different information model views, profiles, are available for this resource.
NVS html view ? Default NVS html view.